Low frequency noise measurement of three-axis surface micro-machined silicon capacitive accelerometer

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Low frequency noise measurement of three-axis surface micro-machined silicon capacitive accelerometer

Low frequency noise measurement of three-axis surface micro-machined silicon capacitive accelerometer

Bibliographic Details
Main Authors:	Mohd-Yasin, F., Nagel, D. J., Korman, C. E., Ong, D. S., Chuah, H. T.
Format:	Conference or Workshop Item
Published:	2007
Subjects:	T Technology (General) QA75.5-76.95 Electronic computers. Computer science
Online Access:	http://shdl.mmu.edu.my/3185/

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