Low frequency noise measurement and analysis of capacitive micro-accelerometers: Temperature effect

In this work, a noise measurement of capacitive micro-accelerometers incorporating temperature effect is presented. In the setup, a hot plate is used to heat the device up to temperatures in the 75 degree C range. A thermo couple attached to the enclosure is used to assess its temperature. The data...

Full description

Bibliographic Details
Main Authors: Mohd Yasin, Faisal, Nagel, David J., Ong, D. S., Korman, Can E., Chuah, Hean Teik
Format: Conference or Workshop Item
Published: 2007
Subjects:
Online Access:http://shdl.mmu.edu.my/3169/
_version_ 1848790252968214528
author Mohd Yasin, Faisal
Nagel, David J.
Ong, D. S.
Korman, Can E.
Chuah, Hean Teik
author_facet Mohd Yasin, Faisal
Nagel, David J.
Ong, D. S.
Korman, Can E.
Chuah, Hean Teik
author_sort Mohd Yasin, Faisal
building MMU Institutional Repository
collection Online Access
description In this work, a noise measurement of capacitive micro-accelerometers incorporating temperature effect is presented. In the setup, a hot plate is used to heat the device up to temperatures in the 75 degree C range. A thermo couple attached to the enclosure is used to assess its temperature. The data show that the noise power increases at high temperature, but not as significant as predicted by the theory.
first_indexed 2025-11-14T18:09:40Z
format Conference or Workshop Item
id mmu-3169
institution Multimedia University
institution_category Local University
last_indexed 2025-11-14T18:09:40Z
publishDate 2007
recordtype eprints
repository_type Digital Repository
spelling mmu-31692023-02-23T07:56:18Z http://shdl.mmu.edu.my/3169/ Low frequency noise measurement and analysis of capacitive micro-accelerometers: Temperature effect Mohd Yasin, Faisal Nagel, David J. Ong, D. S. Korman, Can E. Chuah, Hean Teik T Technology (General) QA75.5-76.95 Electronic computers. Computer science In this work, a noise measurement of capacitive micro-accelerometers incorporating temperature effect is presented. In the setup, a hot plate is used to heat the device up to temperatures in the 75 degree C range. A thermo couple attached to the enclosure is used to assess its temperature. The data show that the noise power increases at high temperature, but not as significant as predicted by the theory. 2007-11 Conference or Workshop Item NonPeerReviewed Mohd Yasin, Faisal and Nagel, David J. and Ong, D. S. and Korman, Can E. and Chuah, Hean Teik (2007) Low frequency noise measurement and analysis of capacitive micro-accelerometers: Temperature effect. In: 2007 Digest of papers Microprocesses and Nanotechnology, 05-08 Nov 2007, Kyoto, Japan. https://ieeexplore.ieee.org/document/4456261
spellingShingle T Technology (General)
QA75.5-76.95 Electronic computers. Computer science
Mohd Yasin, Faisal
Nagel, David J.
Ong, D. S.
Korman, Can E.
Chuah, Hean Teik
Low frequency noise measurement and analysis of capacitive micro-accelerometers: Temperature effect
title Low frequency noise measurement and analysis of capacitive micro-accelerometers: Temperature effect
title_full Low frequency noise measurement and analysis of capacitive micro-accelerometers: Temperature effect
title_fullStr Low frequency noise measurement and analysis of capacitive micro-accelerometers: Temperature effect
title_full_unstemmed Low frequency noise measurement and analysis of capacitive micro-accelerometers: Temperature effect
title_short Low frequency noise measurement and analysis of capacitive micro-accelerometers: Temperature effect
title_sort low frequency noise measurement and analysis of capacitive micro-accelerometers: temperature effect
topic T Technology (General)
QA75.5-76.95 Electronic computers. Computer science
url http://shdl.mmu.edu.my/3169/
http://shdl.mmu.edu.my/3169/