Low frequency noise measurement and analysis of capacitive micro-accelerometers

Noise measurements of micro-accelerometers were performed using a special measurement system. A common spectral behavior of noise is found, with 1/f noise dominating at low frequencies and white thermal noise being the limiting factor at higher frequencies. Unexpected resonances are also observed in...

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Main Authors: Mohd Yasin, Faisal, Nagel, David J., Ong, Duu Sheng, Korman, Can E., Chuah, Hean Teik
Format: Article
Published: Elsevier B.V. 2007
Subjects:
Online Access:http://shdl.mmu.edu.my/3058/
_version_ 1848790222071922688
author Mohd Yasin, Faisal
Nagel, David J.
Ong, Duu Sheng
Korman, Can E.
Chuah, Hean Teik
author_facet Mohd Yasin, Faisal
Nagel, David J.
Ong, Duu Sheng
Korman, Can E.
Chuah, Hean Teik
author_sort Mohd Yasin, Faisal
building MMU Institutional Repository
collection Online Access
description Noise measurements of micro-accelerometers were performed using a special measurement system. A common spectral behavior of noise is found, with 1/f noise dominating at low frequencies and white thermal noise being the limiting factor at higher frequencies. Unexpected resonances are also observed in the commercial devices. Most importantly, an acceleration dependent of the noise is found in analog devices and freescale accelerometers, in contrast to prevailing theory.
first_indexed 2025-11-14T18:09:11Z
format Article
id mmu-3058
institution Multimedia University
institution_category Local University
last_indexed 2025-11-14T18:09:11Z
publishDate 2007
publisher Elsevier B.V.
recordtype eprints
repository_type Digital Repository
spelling mmu-30582023-02-23T07:59:07Z http://shdl.mmu.edu.my/3058/ Low frequency noise measurement and analysis of capacitive micro-accelerometers Mohd Yasin, Faisal Nagel, David J. Ong, Duu Sheng Korman, Can E. Chuah, Hean Teik T Technology (General) QA75.5-76.95 Electronic computers. Computer science Noise measurements of micro-accelerometers were performed using a special measurement system. A common spectral behavior of noise is found, with 1/f noise dominating at low frequencies and white thermal noise being the limiting factor at higher frequencies. Unexpected resonances are also observed in the commercial devices. Most importantly, an acceleration dependent of the noise is found in analog devices and freescale accelerometers, in contrast to prevailing theory. Elsevier B.V. 2007-05 Article NonPeerReviewed Mohd Yasin, Faisal and Nagel, David J. and Ong, Duu Sheng and Korman, Can E. and Chuah, Hean Teik (2007) Low frequency noise measurement and analysis of capacitive micro-accelerometers. Microelectronic Engineering, 84 (5-8). pp. 1788-1791. ISSN 0167-9317 http://dx.doi.org/10.1016/j.mee.2007.01.168 doi:10.1016/j.mee.2007.01.168 doi:10.1016/j.mee.2007.01.168
spellingShingle T Technology (General)
QA75.5-76.95 Electronic computers. Computer science
Mohd Yasin, Faisal
Nagel, David J.
Ong, Duu Sheng
Korman, Can E.
Chuah, Hean Teik
Low frequency noise measurement and analysis of capacitive micro-accelerometers
title Low frequency noise measurement and analysis of capacitive micro-accelerometers
title_full Low frequency noise measurement and analysis of capacitive micro-accelerometers
title_fullStr Low frequency noise measurement and analysis of capacitive micro-accelerometers
title_full_unstemmed Low frequency noise measurement and analysis of capacitive micro-accelerometers
title_short Low frequency noise measurement and analysis of capacitive micro-accelerometers
title_sort low frequency noise measurement and analysis of capacitive micro-accelerometers
topic T Technology (General)
QA75.5-76.95 Electronic computers. Computer science
url http://shdl.mmu.edu.my/3058/
http://shdl.mmu.edu.my/3058/
http://shdl.mmu.edu.my/3058/