Wong, H., Mohd Shukor, N., & Amin, N. (2007). Prospective development in diffusion barrier layers for copper metallization in LSI. ELSEVIER SCI LTD.
Chicago Style (17th ed.) CitationWong, H.Y, N.F Mohd Shukor, and N. Amin. Prospective Development in Diffusion Barrier Layers for Copper Metallization in LSI. ELSEVIER SCI LTD, 2007.
MLA (9th ed.) CitationWong, H.Y, et al. Prospective Development in Diffusion Barrier Layers for Copper Metallization in LSI. ELSEVIER SCI LTD, 2007.
Warning: These citations may not always be 100% accurate.