Theoretical analysis of breakdown probabilities and jitter in single-photon avalanche diodes

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Theoretical analysis of breakdown probabilities and jitter in single-photon avalanche diodes

A simple random ionization path length model is used to investigate the breakdown probabilities and jitter in single photon avalanche diodes (SPADs) with submicron multiplication widths. The simulation results show that increasing the multiplication width may not necessarily increase the breakdown p...

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Bibliographic Details
Main Authors:	Tan, S. L., Ong, D. S., Yow, H. K.
Format:	Article
Published:	AMER INST PHYSICS 2007
Subjects:	T Technology (General) QC Physics
Online Access:	http://shdl.mmu.edu.my/3019/

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