Theoretical analysis of breakdown probabilities and jitter in single-photon avalanche diodes
A simple random ionization path length model is used to investigate the breakdown probabilities and jitter in single photon avalanche diodes (SPADs) with submicron multiplication widths. The simulation results show that increasing the multiplication width may not necessarily increase the breakdown p...
| Main Authors: | , , |
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| Format: | Article |
| Published: |
AMER INST PHYSICS
2007
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| Subjects: | |
| Online Access: | http://shdl.mmu.edu.my/3019/ |