A Study on Central Moments of the Histograms from Scanning Electron Microscope Charging Images
This paper presents a study on using the statistical parameter, central moment, to describe the properties of the histograms of scanning electron microscope (SEM) images. Various charging effects of SEM images and the corresponding histogram profiles are analyzed. The central moment distributions ar...
| Main Authors: | , , |
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| Format: | Article |
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JOHN WILEY & SONS INC
2007
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| Online Access: | http://shdl.mmu.edu.my/3018/ |
| _version_ | 1848790211417341952 |
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| author | Tan, Y. Y. Sim, K. S. Tso, C. P. |
| author_facet | Tan, Y. Y. Sim, K. S. Tso, C. P. |
| author_sort | Tan, Y. Y. |
| building | MMU Institutional Repository |
| collection | Online Access |
| description | This paper presents a study on using the statistical parameter, central moment, to describe the properties of the histograms of scanning electron microscope (SEM) images. Various charging effects of SEM images and the corresponding histogram profiles are analyzed. The central moment distributions are used to describe the overview of the histograms of an image. The results show that central moments can be used to quantify and characterize the charging images. In particular, the second moment (variance) and third moment (skewness) can be used to distinguish the differences between charging and noncharging images. |
| first_indexed | 2025-11-14T18:09:00Z |
| format | Article |
| id | mmu-3018 |
| institution | Multimedia University |
| institution_category | Local University |
| last_indexed | 2025-11-14T18:09:00Z |
| publishDate | 2007 |
| publisher | JOHN WILEY & SONS INC |
| recordtype | eprints |
| repository_type | Digital Repository |
| spelling | mmu-30182011-09-29T06:33:15Z http://shdl.mmu.edu.my/3018/ A Study on Central Moments of the Histograms from Scanning Electron Microscope Charging Images Tan, Y. Y. Sim, K. S. Tso, C. P. T Technology (General) QA75.5-76.95 Electronic computers. Computer science This paper presents a study on using the statistical parameter, central moment, to describe the properties of the histograms of scanning electron microscope (SEM) images. Various charging effects of SEM images and the corresponding histogram profiles are analyzed. The central moment distributions are used to describe the overview of the histograms of an image. The results show that central moments can be used to quantify and characterize the charging images. In particular, the second moment (variance) and third moment (skewness) can be used to distinguish the differences between charging and noncharging images. JOHN WILEY & SONS INC 2007-09 Article NonPeerReviewed Tan, Y. Y. and Sim, K. S. and Tso, C. P. (2007) A Study on Central Moments of the Histograms from Scanning Electron Microscope Charging Images. Scanning, 29 (5). pp. 211-218. ISSN 01610457 http://dx.doi.org/10.1002/sca.20065 doi:10.1002/sca.20065 doi:10.1002/sca.20065 |
| spellingShingle | T Technology (General) QA75.5-76.95 Electronic computers. Computer science Tan, Y. Y. Sim, K. S. Tso, C. P. A Study on Central Moments of the Histograms from Scanning Electron Microscope Charging Images |
| title | A Study on Central Moments of the Histograms from Scanning Electron Microscope Charging Images |
| title_full | A Study on Central Moments of the Histograms from Scanning Electron Microscope Charging Images |
| title_fullStr | A Study on Central Moments of the Histograms from Scanning Electron Microscope Charging Images |
| title_full_unstemmed | A Study on Central Moments of the Histograms from Scanning Electron Microscope Charging Images |
| title_short | A Study on Central Moments of the Histograms from Scanning Electron Microscope Charging Images |
| title_sort | study on central moments of the histograms from scanning electron microscope charging images |
| topic | T Technology (General) QA75.5-76.95 Electronic computers. Computer science |
| url | http://shdl.mmu.edu.my/3018/ http://shdl.mmu.edu.my/3018/ http://shdl.mmu.edu.my/3018/ |