Effect of doping concentration on avalanche multiplication and excess noise factor in submicron APD

A realistic full-band Monte Carlo (FBMC) model is applied to study the effect of doping concentration on multiplication gain and excess noise factor for electron- and hole-initiated multiplication ill thin InP p(+)-i-n(+) diodes with a range of multiplication lengths of w = 0.1 and 0.24 mu m. This m...

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Bibliographic Details
Main Authors: YOU, A, CHEANG, P
Format: Article
Language:English
Published: PERGAMON-ELSEVIER SCIENCE LTD 2008
Subjects:
Online Access:http://shdl.mmu.edu.my/2752/
http://shdl.mmu.edu.my/2752/1/792.pdf