APA (7th ed.) Citation

Singh, A. K. (2008). An analytical study of hot-carrier degradation effects in sub-micron MOS devices. EDP SCIENCES S A.

Chicago Style (17th ed.) Citation

Singh, A. K. An Analytical Study of Hot-carrier Degradation Effects in Sub-micron MOS Devices. EDP SCIENCES S A, 2008.

MLA (9th ed.) Citation

Singh, A. K. An Analytical Study of Hot-carrier Degradation Effects in Sub-micron MOS Devices. EDP SCIENCES S A, 2008.

Warning: These citations may not always be 100% accurate.