APA (7th ed.) Citation

Lee, W. P., Seow, W. S., Yow, H. K., & Tou, T. Y. (2001). Analysis of Atomic Force Microscopy Images of Crystal Originated “Particles” on Silicon Wafers Treated with NH4OH: H2O2:H2O Solution. The Japan Society of Applied Physics.

Chicago Style (17th ed.) Citation

Lee, W. P., W. S. Seow, H. K. Yow, and T. Y. Tou. Analysis of Atomic Force Microscopy Images of Crystal Originated “Particles” on Silicon Wafers Treated with NH4OH: H2O2:H2O Solution. The Japan Society of Applied Physics, 2001.

MLA (9th ed.) Citation

Lee, W. P., et al. Analysis of Atomic Force Microscopy Images of Crystal Originated “Particles” on Silicon Wafers Treated with NH4OH: H2O2:H2O Solution. The Japan Society of Applied Physics, 2001.