Effect of shot noise and secondary emission noise in scanning electron microscope images

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Effect of shot noise and secondary emission noise in scanning electron microscope images

The effect of shot noise and emission noise due to materials that have different emission properties was simulated. Local variations in emission properties affect the overall signal-to-noise ratio (SNR) value of the scanning electron microscope image. In the case in which emission noise is assumed t...

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Bibliographic Details
Main Authors:	Sim,, KS, Phang, , JCH, Thong, , JTL
Format:	Article
Published:	2004
Subjects:	TA Engineering (General). Civil engineering (General)
Online Access:	http://shdl.mmu.edu.my/2505/

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