Effect of shot noise and secondary emission noise in scanning electron microscope images
The effect of shot noise and emission noise due to materials that have different emission properties was simulated. Local variations in emission properties affect the overall signal-to-noise ratio (SNR) value of the scanning electron microscope image. In the case in which emission noise is assumed t...
| Main Authors: | , , |
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| Format: | Article |
| Published: |
2004
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| Subjects: | |
| Online Access: | http://shdl.mmu.edu.my/2505/ |