APA (7th ed.) Citation

Sim,, K., Phang, & Thong. (2004). Effect of shot noise and secondary emission noise in scanning electron microscope images.

Chicago Style (17th ed.) Citation

Sim,, KS, Phang, and Thong. Effect of Shot Noise and Secondary Emission Noise in Scanning Electron Microscope Images. 2004.

MLA (9th ed.) Citation

Sim,, KS, et al. Effect of Shot Noise and Secondary Emission Noise in Scanning Electron Microscope Images. 2004.