Random response time of thin avalanche photodiodes

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Random response time of thin avalanche photodiodes

The avalanche built-up time using random response time model for avalanche photodiode (APD) is presented. A random response time model considers the randomness of times at which the primary and secondary carriers exit the multiplication region. The dead-space effect is included in our model to demon...

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Bibliographic Details
Main Authors:	You, A. H., Ong, D. S.
Format:	Article
Language:	English
Published:	2004
Subjects:	TA Engineering (General). Civil engineering (General)
Online Access:	http://shdl.mmu.edu.my/2437/ http://shdl.mmu.edu.my/2437/1/1709.pdf

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