Random response time of thin avalanche photodiodes
The avalanche built-up time using random response time model for avalanche photodiode (APD) is presented. A random response time model considers the randomness of times at which the primary and secondary carriers exit the multiplication region. The dead-space effect is included in our model to demon...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
2004
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| Subjects: | |
| Online Access: | http://shdl.mmu.edu.my/2437/ http://shdl.mmu.edu.my/2437/1/1709.pdf |