Avalanche Multiplication and Noise Characteristics of Thin InP p+–i–n+Diodes

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Avalanche Multiplication and Noise Characteristics of Thin InP p+–i–n+Diodes

A simple random path length model for computing the statistics of avalanche gain and excess noise factor in thin InP p(+)-i-n(+) diodes is presented. We incorporate the dead-space effect in our model, which is expected to play an important role in reducing noise in homejunction InP avalanche photodi...

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Bibliographic Details
Main Authors:	You, Ah Heng, Ong, Duu Sheng
Format:	Article
Published:	2004
Subjects:	QC Physics
Online Access:	http://shdl.mmu.edu.my/2430/

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