Avalanche Multiplication and Noise Characteristics of Thin InP p+–i–n+Diodes
A simple random path length model for computing the statistics of avalanche gain and excess noise factor in thin InP p(+)-i-n(+) diodes is presented. We incorporate the dead-space effect in our model, which is expected to play an important role in reducing noise in homejunction InP avalanche photodi...
| Main Authors: | , |
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| Format: | Article |
| Published: |
2004
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| Subjects: | |
| Online Access: | http://shdl.mmu.edu.my/2430/ |