SIM, K. S., & WHITE, J. D. (2005). New technique for in-situ measurement of backscattered and secondary electron yields for the calculation of signal-to-noise ratio in a SEM.
Chicago Style (17th ed.) CitationSIM, K. S., and J. D. WHITE. New Technique for In-situ Measurement of Backscattered and Secondary Electron Yields for the Calculation of Signal-to-noise Ratio in a SEM. 2005.
MLA (9th ed.) CitationSIM, K. S., and J. D. WHITE. New Technique for In-situ Measurement of Backscattered and Secondary Electron Yields for the Calculation of Signal-to-noise Ratio in a SEM. 2005.
Warning: These citations may not always be 100% accurate.