Chan, K., & Teo, B. (2005). Sputtering power and deposition pressure effects on the electrical and structural properties of copper thin films.
Chicago Style (17th ed.) CitationChan, Kah-Yoong, and Bee-San Teo. Sputtering Power and Deposition Pressure Effects on the Electrical and Structural Properties of Copper Thin Films. 2005.
MLA (9th ed.) CitationChan, Kah-Yoong, and Bee-San Teo. Sputtering Power and Deposition Pressure Effects on the Electrical and Structural Properties of Copper Thin Films. 2005.
Warning: These citations may not always be 100% accurate.