Stochastic re-entrant line modeling for an environment stress testing in a semiconductor assembly industry

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Stochastic re-entrant line modeling for an environment stress testing in a semiconductor assembly industry

Environmental stress testing (EST) is a reliability test for the semiconductor products that is concerned with how products perform its intended functions under some environmental conditions. Planning, implementation and delivery schedules are affected by the outcome of these tests and it is crucial...

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Bibliographic Details
Main Authors:	KUMAR, S, OMAR, M
Format:	Article
Language:	English
Published:	2006
Subjects:	QA Mathematics
Online Access:	http://shdl.mmu.edu.my/2008/ http://shdl.mmu.edu.my/2008/1/1354.pdf

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