Stochastic re-entrant line modeling for an environment stress testing in a semiconductor assembly industry
Environmental stress testing (EST) is a reliability test for the semiconductor products that is concerned with how products perform its intended functions under some environmental conditions. Planning, implementation and delivery schedules are affected by the outcome of these tests and it is crucial...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
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2006
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| Subjects: | |
| Online Access: | http://shdl.mmu.edu.my/2008/ http://shdl.mmu.edu.my/2008/1/1354.pdf |