KUMAR, S., & OMAR, M. (2006). Stochastic re-entrant line modeling for an environment stress testing in a semiconductor assembly industry.
Chicago Style (17th ed.) CitationKUMAR, S., and M. OMAR. Stochastic Re-entrant Line Modeling for an Environment Stress Testing in a Semiconductor Assembly Industry. 2006.
MLA (9th ed.) CitationKUMAR, S., and M. OMAR. Stochastic Re-entrant Line Modeling for an Environment Stress Testing in a Semiconductor Assembly Industry. 2006.
Warning: These citations may not always be 100% accurate.