A convenient method for complex permittivity measurement of thin materials at microwave frequencies
A practical problem in the reflection method for measuring permittivity of thin materials is the difficulty in ensuring the sample is placed exactly at the waveguide flange. A small position offset of the dielectric slab will give rise to significant errors in calculating the permittivity. To circum...
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| Format: | Article |
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2006
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| Online Access: | http://shdl.mmu.edu.my/1972/ |