Mining Test Path Signatures For Analysis And Improvement Of Microchip Testing Programs

A Test Program(TP) is constantly modified with the aim to reduce test cost. This research aims at revealing the effect of test changes on a microchip TP so that TP enhancement can be performed effectively.

Bibliographic Details
Main Author:	Lee, Jia Keat
Format:	Thesis
Published:	2008
Subjects:	TK7800-8360 Electronics
Online Access:	http://shdl.mmu.edu.my/1667/

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