Mining Test Path Signatures For Analysis And Improvement Of Microchip Testing Programs

A Test Program(TP) is constantly modified with the aim to reduce test cost. This research aims at revealing the effect of test changes on a microchip TP so that TP enhancement can be performed effectively.

Bibliographic Details
Main Author: Lee, Jia Keat
Format: Thesis
Published: 2008
Subjects:
Online Access:http://shdl.mmu.edu.my/1667/