Mining Test Path Signatures For Analysis And Improvement Of Microchip Testing Programs
A Test Program(TP) is constantly modified with the aim to reduce test cost. This research aims at revealing the effect of test changes on a microchip TP so that TP enhancement can be performed effectively.
| Main Author: | |
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| Format: | Thesis |
| Published: |
2008
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| Subjects: | |
| Online Access: | http://shdl.mmu.edu.my/1667/ |
| _version_ | 1848789854429642752 |
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| author | Lee, Jia Keat |
| author_facet | Lee, Jia Keat |
| author_sort | Lee, Jia Keat |
| building | MMU Institutional Repository |
| collection | Online Access |
| description | A Test Program(TP) is constantly modified with the aim to reduce test cost. This research aims at revealing the effect of test changes on a microchip TP so that TP enhancement can be performed effectively. |
| first_indexed | 2025-11-14T18:03:20Z |
| format | Thesis |
| id | mmu-1667 |
| institution | Multimedia University |
| institution_category | Local University |
| last_indexed | 2025-11-14T18:03:20Z |
| publishDate | 2008 |
| recordtype | eprints |
| repository_type | Digital Repository |
| spelling | mmu-16672010-09-23T02:17:05Z http://shdl.mmu.edu.my/1667/ Mining Test Path Signatures For Analysis And Improvement Of Microchip Testing Programs Lee, Jia Keat TK7800-8360 Electronics A Test Program(TP) is constantly modified with the aim to reduce test cost. This research aims at revealing the effect of test changes on a microchip TP so that TP enhancement can be performed effectively. 2008-12 Thesis NonPeerReviewed Lee, Jia Keat (2008) Mining Test Path Signatures For Analysis And Improvement Of Microchip Testing Programs. Masters thesis, Multimedia University. http://myto.perpun.net.my/metoalogin/logina.php |
| spellingShingle | TK7800-8360 Electronics Lee, Jia Keat Mining Test Path Signatures For Analysis And Improvement Of Microchip Testing Programs |
| title | Mining Test Path Signatures For Analysis And Improvement Of Microchip Testing Programs |
| title_full | Mining Test Path Signatures For Analysis And Improvement Of Microchip Testing Programs |
| title_fullStr | Mining Test Path Signatures For Analysis And Improvement Of Microchip Testing Programs |
| title_full_unstemmed | Mining Test Path Signatures For Analysis And Improvement Of Microchip Testing Programs |
| title_short | Mining Test Path Signatures For Analysis And Improvement Of Microchip Testing Programs |
| title_sort | mining test path signatures for analysis and improvement of microchip testing programs |
| topic | TK7800-8360 Electronics |
| url | http://shdl.mmu.edu.my/1667/ http://shdl.mmu.edu.my/1667/ |