Choong, C. L. (2006). Effect Of Temperature And Electric Field On Polysilicon Gettering Of Copper Impurities In Silicon Wafer.
Chicago Style (17th ed.) CitationChoong, Chwee Lin. Effect Of Temperature And Electric Field On Polysilicon Gettering Of Copper Impurities In Silicon Wafer. 2006.
MLA (9th ed.) CitationChoong, Chwee Lin. Effect Of Temperature And Electric Field On Polysilicon Gettering Of Copper Impurities In Silicon Wafer. 2006.
Warning: These citations may not always be 100% accurate.