Investigation of the electrical properties of metal chalcogenide thin films: A review

Investigation of the electrical properties of metal chalcogenide thin films: A review

In the present study, thin films have been successfully prepared by using various deposition methods. The electrical behaviors of obtained thin films were investigated by using Hall Effect measurement and Van Der Pauw technique as reported by many researchers. The experiment results show that the...

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Bibliographic Details
Main Author: Ho, Soon Min
Format: Article
Language:English
Published: Scholars Research Library 2016
Subjects:
TA Engineering (General). Civil engineering (General)
Online Access:http://eprints.intimal.edu.my/489/
http://eprints.intimal.edu.my/489/1/Investigation%20of%20the%20electrical%20properties%20of%20metal%20chalcogenide%20thin%20films_a%20review.pdf

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