A scanning electron microscopy investigation of semiconductor metal chalcogenide thin films: A review

A scanning electron microscopy investigation of semiconductor metal chalcogenide thin films: A review

Nowadays, scanning electron microscopy is a valuable tool that could be applied in a number of applications including forensic sciences, metallurgy and nanotechnologies. In view of researchers, it provides a better overall visual image of the sample and makes the quick resolution of tough analytic...

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Bibliographic Details
Main Author: Ho, Soon Min
Format: Article
Language:English
Published: Scholars Research Library 2016
Subjects:
TA Engineering (General). Civil engineering (General)
Online Access:http://eprints.intimal.edu.my/480/
http://eprints.intimal.edu.my/480/1/A%20scanning%20electron%20microscopy%20investigation%20of%20semiconductor%20metal%20chalcogenide%20thin%20films_a%20review.pdf

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