A scanning electron microscopy investigation of semiconductor metal chalcogenide thin films: A review
Nowadays, scanning electron microscopy is a valuable tool that could be applied in a number of applications including forensic sciences, metallurgy and nanotechnologies. In view of researchers, it provides a better overall visual image of the sample and makes the quick resolution of tough analytic...
| Main Author: | |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Scholars Research Library
2016
|
| Subjects: | |
| Online Access: | http://eprints.intimal.edu.my/480/ http://eprints.intimal.edu.my/480/1/A%20scanning%20electron%20microscopy%20investigation%20of%20semiconductor%20metal%20chalcogenide%20thin%20films_a%20review.pdf |