A scanning electron microscopy investigation of semiconductor metal chalcogenide thin films: A review
Nowadays, scanning electron microscopy is a valuable tool that could be applied in a number of applications including forensic sciences, metallurgy and nanotechnologies. In view of researchers, it provides a better overall visual image of the sample and makes the quick resolution of tough analytic...
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| Format: | Article |
| Language: | English |
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Scholars Research Library
2016
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| Online Access: | http://eprints.intimal.edu.my/480/ http://eprints.intimal.edu.my/480/1/A%20scanning%20electron%20microscopy%20investigation%20of%20semiconductor%20metal%20chalcogenide%20thin%20films_a%20review.pdf |
| _version_ | 1848766486398631936 |
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| author | Ho, Soon Min |
| author_facet | Ho, Soon Min |
| author_sort | Ho, Soon Min |
| building | INTI Institutional Repository |
| collection | Online Access |
| description | Nowadays, scanning electron microscopy is a valuable tool that could be applied in a number of applications
including forensic sciences, metallurgy and nanotechnologies. In view of researchers, it provides a better overall
visual image of the sample and makes the quick resolution of tough analytical problems effectively. In this work, the
characterization of thin films prepared under various deposition conditions by using scanning electron microscopy
was discussed and reported. |
| first_indexed | 2025-11-14T11:51:55Z |
| format | Article |
| id | intimal-480 |
| institution | INTI International University |
| institution_category | Local University |
| language | English |
| last_indexed | 2025-11-14T11:51:55Z |
| publishDate | 2016 |
| publisher | Scholars Research Library |
| recordtype | eprints |
| repository_type | Digital Repository |
| spelling | intimal-4802016-11-24T08:31:57Z http://eprints.intimal.edu.my/480/ A scanning electron microscopy investigation of semiconductor metal chalcogenide thin films: A review Ho, Soon Min TA Engineering (General). Civil engineering (General) Nowadays, scanning electron microscopy is a valuable tool that could be applied in a number of applications including forensic sciences, metallurgy and nanotechnologies. In view of researchers, it provides a better overall visual image of the sample and makes the quick resolution of tough analytical problems effectively. In this work, the characterization of thin films prepared under various deposition conditions by using scanning electron microscopy was discussed and reported. Scholars Research Library 2016 Article PeerReviewed text en http://eprints.intimal.edu.my/480/1/A%20scanning%20electron%20microscopy%20investigation%20of%20semiconductor%20metal%20chalcogenide%20thin%20films_a%20review.pdf Ho, Soon Min (2016) A scanning electron microscopy investigation of semiconductor metal chalcogenide thin films: A review. Der Pharma Chemica, 8 (2). pp. 13-16. ISSN 0975-413X http://derpharmachemica.com/2016-vol-8-issue-2.html |
| spellingShingle | TA Engineering (General). Civil engineering (General) Ho, Soon Min A scanning electron microscopy investigation of semiconductor metal chalcogenide thin films: A review |
| title | A scanning electron microscopy investigation of semiconductor metal
chalcogenide thin films: A review |
| title_full | A scanning electron microscopy investigation of semiconductor metal
chalcogenide thin films: A review |
| title_fullStr | A scanning electron microscopy investigation of semiconductor metal
chalcogenide thin films: A review |
| title_full_unstemmed | A scanning electron microscopy investigation of semiconductor metal
chalcogenide thin films: A review |
| title_short | A scanning electron microscopy investigation of semiconductor metal
chalcogenide thin films: A review |
| title_sort | scanning electron microscopy investigation of semiconductor metal
chalcogenide thin films: a review |
| topic | TA Engineering (General). Civil engineering (General) |
| url | http://eprints.intimal.edu.my/480/ http://eprints.intimal.edu.my/480/ http://eprints.intimal.edu.my/480/1/A%20scanning%20electron%20microscopy%20investigation%20of%20semiconductor%20metal%20chalcogenide%20thin%20films_a%20review.pdf |