A scanning electron microscopy investigation of semiconductor metal chalcogenide thin films: A review
Nowadays, scanning electron microscopy is a valuable tool that could be applied in a number of applications including forensic sciences, metallurgy and nanotechnologies. In view of researchers, it provides a better overall visual image of the sample and makes the quick resolution of tough analytic...
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| Format: | Article |
| Language: | English |
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Scholars Research Library
2016
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| Online Access: | http://eprints.intimal.edu.my/480/ http://eprints.intimal.edu.my/480/1/A%20scanning%20electron%20microscopy%20investigation%20of%20semiconductor%20metal%20chalcogenide%20thin%20films_a%20review.pdf |
| Summary: | Nowadays, scanning electron microscopy is a valuable tool that could be applied in a number of applications
including forensic sciences, metallurgy and nanotechnologies. In view of researchers, it provides a better overall
visual image of the sample and makes the quick resolution of tough analytical problems effectively. In this work, the
characterization of thin films prepared under various deposition conditions by using scanning electron microscopy
was discussed and reported. |
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