Trimming of atomic force microscope probe tip by ion milling

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Trimming of atomic force microscope probe tip by ion milling

Bibliographic Details
Main Authors:	Ali, Mohammad Yeakub, Lim, B.H.
Format:	Book Chapter
Language:	English
Published:	IIUM Press 2011
Subjects:	TA Engineering (General). Civil engineering (General)
Online Access:	http://irep.iium.edu.my/17714/ http://irep.iium.edu.my/17714/1/Chapter_43.pdf

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