Trimming of atomic force microscope probe tip by ion milling

Trimming of atomic force microscope probe tip by ion milling

Bibliographic Details
Main Authors: Ali, Mohammad Yeakub, Lim, B.H.
Format: Book Chapter
Language:English
Published: IIUM Press 2011
Subjects:
TA Engineering (General). Civil engineering (General)
Online Access:http://irep.iium.edu.my/17714/
http://irep.iium.edu.my/17714/1/Chapter_43.pdf

Internet

http://irep.iium.edu.my/17714/
http://irep.iium.edu.my/17714/1/Chapter_43.pdf

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