Genetic characterization of adult-plant resistance to tan spot (syn, yellow spot) in wheat
Key message: QTL mapping identified key genomic regions associated with adult-plant resistance to tan spot, which are effective even in the presence of the sensitivity gene Tsn1, thus serving as a new genetic solution to develop disease-resistant wheat cultivars. Abstract: Improving resistance t...
| Main Authors: | , , , , , , , , , |
|---|---|
| Format: | Journal Article |
| Language: | English |
| Published: |
SPRINGER
2021
|
| Subjects: | |
| Online Access: | http://hdl.handle.net/20.500.11937/87606 |