Genetic characterization of adult-plant resistance to tan spot (syn, yellow spot) in wheat

Key message: QTL mapping identified key genomic regions associated with adult-plant resistance to tan spot, which are effective even in the presence of the sensitivity gene Tsn1, thus serving as a new genetic solution to develop disease-resistant wheat cultivars. Abstract: Improving resistance t...

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Bibliographic Details
Main Authors: Dinglasan, E.G., Peressini, T., Marathamuthu, Kalai, See, Pao Theen, Snyman, L., Platz, G., Godwin, I., Voss-Fels, K.P., Moffat, Caroline, Hickey, L.T.
Format: Journal Article
Language:English
Published: SPRINGER 2021
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Online Access:http://hdl.handle.net/20.500.11937/87606