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Improved engineering model for interfacial shearing stress analysis of a heated three layered structure in Electronic Packaging
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Improved engineering model for interfacial shearing stress analysis of a heated three layered structure in Electronic Packaging

Bibliographic Details
Main Authors: Debnath, Sujan, Murthy, M., Seetharamu, K., Hassan, A.
Other Authors: University Technology Mara
Format: Conference Paper
Published: University Technology Mara 2009
Online Access:http://hdl.handle.net/20.500.11937/8560
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http://hdl.handle.net/20.500.11937/8560

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