Electric current-restrained crack propagation in brittle GaN ceramics

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Electric current-restrained crack propagation in brittle GaN ceramics

© 2021, The Author(s), under exclusive licence to Springer Science+Business Media, LLC part of Springer Nature. The reliability of a ceramic structure or device is closely related to its faults, such as structural defects and cracks. Here, we show that cracking in piezoelectric semi-conductive ceram...

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Bibliographic Details
Main Authors:	Zhao, M.H., Umair, M., Lu, Chunsheng, Qin, G.S.
Format:	Journal Article
Language:	English
Published:	SPRINGER 2021
Subjects:	Science & Technology Technology Materials Science, Multidisciplinary Materials Science FRACTURE-TOUGHNESS CONDUCTIVE CRACKS FIELD BEHAVIOR FAILURE
Online Access:	http://hdl.handle.net/20.500.11937/82381

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