Electric current-restrained crack propagation in brittle GaN ceramics
© 2021, The Author(s), under exclusive licence to Springer Science+Business Media, LLC part of Springer Nature. The reliability of a ceramic structure or device is closely related to its faults, such as structural defects and cracks. Here, we show that cracking in piezoelectric semi-conductive ceram...
| Main Authors: | , , , |
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| Format: | Journal Article |
| Language: | English |
| Published: |
SPRINGER
2021
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| Subjects: | |
| Online Access: | http://hdl.handle.net/20.500.11937/82381 |