Electric current-restrained crack propagation in brittle GaN ceramics

© 2021, The Author(s), under exclusive licence to Springer Science+Business Media, LLC part of Springer Nature. The reliability of a ceramic structure or device is closely related to its faults, such as structural defects and cracks. Here, we show that cracking in piezoelectric semi-conductive ceram...

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Main Authors: Zhao, M.H., Umair, M., Lu, Chunsheng, Qin, G.S.
Format: Journal Article
Language:English
Published: SPRINGER 2021
Subjects:
Online Access:http://hdl.handle.net/20.500.11937/82381
_version_ 1848764497359011840
author Zhao, M.H.
Umair, M.
Lu, Chunsheng
Qin, G.S.
author_facet Zhao, M.H.
Umair, M.
Lu, Chunsheng
Qin, G.S.
author_sort Zhao, M.H.
building Curtin Institutional Repository
collection Online Access
description © 2021, The Author(s), under exclusive licence to Springer Science+Business Media, LLC part of Springer Nature. The reliability of a ceramic structure or device is closely related to its faults, such as structural defects and cracks. Here, we show that cracking in piezoelectric semi-conductive ceramics (PSCs) can be restrained with the application of an electric current. Due to the crack-generated flexoelectricity, piezoelectric polarization charges that generate and gather on the front of a crack result in a strong thermoelectric effect. The phase transition and plastic deformation happened near a crack tip can hinder the propagation of the crack and even lead to its partial closure. These new findings are instructive to study the crack control and the design of PSC devices with damage tolerance.
first_indexed 2025-11-14T11:20:18Z
format Journal Article
id curtin-20.500.11937-82381
institution Curtin University Malaysia
institution_category Local University
language English
last_indexed 2025-11-14T11:20:18Z
publishDate 2021
publisher SPRINGER
recordtype eprints
repository_type Digital Repository
spelling curtin-20.500.11937-823812021-06-28T02:19:25Z Electric current-restrained crack propagation in brittle GaN ceramics Zhao, M.H. Umair, M. Lu, Chunsheng Qin, G.S. Science & Technology Technology Materials Science, Multidisciplinary Materials Science FRACTURE-TOUGHNESS CONDUCTIVE CRACKS FIELD BEHAVIOR FAILURE © 2021, The Author(s), under exclusive licence to Springer Science+Business Media, LLC part of Springer Nature. The reliability of a ceramic structure or device is closely related to its faults, such as structural defects and cracks. Here, we show that cracking in piezoelectric semi-conductive ceramics (PSCs) can be restrained with the application of an electric current. Due to the crack-generated flexoelectricity, piezoelectric polarization charges that generate and gather on the front of a crack result in a strong thermoelectric effect. The phase transition and plastic deformation happened near a crack tip can hinder the propagation of the crack and even lead to its partial closure. These new findings are instructive to study the crack control and the design of PSC devices with damage tolerance. 2021 Journal Article http://hdl.handle.net/20.500.11937/82381 10.1007/s10853-020-05692-2 English SPRINGER restricted
spellingShingle Science & Technology
Technology
Materials Science, Multidisciplinary
Materials Science
FRACTURE-TOUGHNESS
CONDUCTIVE CRACKS
FIELD
BEHAVIOR
FAILURE
Zhao, M.H.
Umair, M.
Lu, Chunsheng
Qin, G.S.
Electric current-restrained crack propagation in brittle GaN ceramics
title Electric current-restrained crack propagation in brittle GaN ceramics
title_full Electric current-restrained crack propagation in brittle GaN ceramics
title_fullStr Electric current-restrained crack propagation in brittle GaN ceramics
title_full_unstemmed Electric current-restrained crack propagation in brittle GaN ceramics
title_short Electric current-restrained crack propagation in brittle GaN ceramics
title_sort electric current-restrained crack propagation in brittle gan ceramics
topic Science & Technology
Technology
Materials Science, Multidisciplinary
Materials Science
FRACTURE-TOUGHNESS
CONDUCTIVE CRACKS
FIELD
BEHAVIOR
FAILURE
url http://hdl.handle.net/20.500.11937/82381