Robustness of the quantitative phase analysis of X-ray diffraction data by the Rietveld method

The quality of X-ray powder diffraction data and the number and type of refinable parameters has been examined with respect to their effect on quantitative phase analysis (QPA) by the Rietveld method using data collected from two samples from the QPA round robin [Madsen et al. J. Appl. Cryst. (2...

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Bibliographic Details
Main Author: Rowles, Matthew
Format: Journal Article
Subjects:
Online Access:http://hdl.handle.net/20.500.11937/81894