Nanoscale processes of trace element mobility in metamorphosed zircon

Nanoscale processes of trace element mobility in metamorphosed zircon

© 2019, Springer-Verlag GmbH Germany, part of Springer Nature. Several examples of zircon grains from high- to ultrahigh-pressure (UHP) and ultrahigh-temperature (UHT) metapelites exhibit a characteristic, yet atypical, core–rim interface domain < 5-μm wide observed in cathodoluminescence (CL) im...

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Bibliographic Details
Main Authors: Peterman, E.M., Reddy, Steven, Saxey, David, Fougerouse, Denis, Snoeyenbos, D.R., Rickard, William
Format: Journal Article
Language:English
Published: SPRINGER 2019
Subjects:
Science & Technology
Physical Sciences
Geochemistry & Geophysics
Mineralogy
Zircon
Atom probe tomography
Nanoscale
Interface-coupled dissolution-reprecipitation
Trace element geochemistry
Metamorphism
ATOM-PROBE TOMOGRAPHY
PARTIALLY METAMICT ZIRCON
HIGH-GRADE METAMORPHISM
RARE-EARTH-ELEMENTS
U-PB GEOCHRONOLOGY
RADIATION-DAMAGE
DISSOLUTION-REPRECIPITATION
PLASTIC-DEFORMATION
ACCESSORY MINERALS
MAGMATIC ZIRCON
Online Access:http://hdl.handle.net/20.500.11937/79364

Internet

http://hdl.handle.net/20.500.11937/79364

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