Novel Applications of FIB-SEM-Based ToF-SIMS in Atom Probe Tomography Workflows
Copyright © Microscopy Society of America 2020. Atom probe tomography (APT) is used to quantify atomic-scale elemental and isotopic compositional variations within a very small volume of material (typically <0.01 μm3). The small analytical volume ideally contains specific compositional or microst...
| Main Authors: | Rickard, William, Reddy, Steven, Saxey, David, Fougerouse, Denis, Timms, Nick, Daly, L., Peterman, E., Cavosie, Aaron, Jourdan, Fred |
|---|---|
| Format: | Journal Article |
| Language: | English |
| Published: |
2020
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| Subjects: | |
| Online Access: | http://purl.org/au-research/grants/arc/DE190101307 http://hdl.handle.net/20.500.11937/79363 |
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