Novel Applications of FIB-SEM-Based ToF-SIMS in Atom Probe Tomography Workflows

Novel Applications of FIB-SEM-Based ToF-SIMS in Atom Probe Tomography Workflows

Copyright © Microscopy Society of America 2020. Atom probe tomography (APT) is used to quantify atomic-scale elemental and isotopic compositional variations within a very small volume of material (typically <0.01 μm3). The small analytical volume ideally contains specific compositional or microst...

Full description

Bibliographic Details
Main Authors: Rickard, William, Reddy, Steven, Saxey, David, Fougerouse, Denis, Timms, Nick, Daly, L., Peterman, E., Cavosie, Aaron, Jourdan, Fred
Format: Journal Article
Language:English
Published: 2020
Subjects:
FIB-SEM
FIB-ToF-SIMS
atom probe tomograpy
sample preparation
Online Access:http://purl.org/au-research/grants/arc/DE190101307
http://hdl.handle.net/20.500.11937/79363

Internet

http://purl.org/au-research/grants/arc/DE190101307
http://hdl.handle.net/20.500.11937/79363

Similar Items