APA (7th ed.) Citation

Rickard, W., Reddy, S., Saxey, D., Fougerouse, D., Timms, N., Daly, L., . . . Jourdan, F. (2020). Novel Applications of FIB-SEM-Based ToF-SIMS in Atom Probe Tomography Workflows.

Chicago Style (17th ed.) Citation

Rickard, William, Steven Reddy, David Saxey, Denis Fougerouse, Nick Timms, L. Daly, E. Peterman, Aaron Cavosie, and Fred Jourdan. Novel Applications of FIB-SEM-Based ToF-SIMS in Atom Probe Tomography Workflows. 2020.

MLA (9th ed.) Citation

Rickard, William, et al. Novel Applications of FIB-SEM-Based ToF-SIMS in Atom Probe Tomography Workflows. 2020.