Defining the Potential of Nanoscale Re-Os Isotope Systematics Using Atom Probe Microscopy

Defining the Potential of Nanoscale Re-Os Isotope Systematics Using Atom Probe Microscopy

Atom probe microscopy (APM) is a relatively new in situ tool for measuring isotope fractions from nanoscale volumes (< 0.01 µm3). We calculate the theoretical detectable difference of an isotope ratio measurement result from APM using counting statistics of a hypothetical data set to be ± 4d...

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Bibliographic Details
Main Authors: Daly, L., Bland, Phil, Tessalina, Svetlana, Saxey, David, Reddy, Steven, Fougerouse, Denis, Rickard, William, Forman, Lucy, La Fontaine, A., Cairney, J., Ringer, S., Schaefer, B., Schwander, D.
Format: Journal Article
Published: Wiley-Blackwell Publishing 2018
Online Access:http://hdl.handle.net/20.500.11937/72050

Internet

http://hdl.handle.net/20.500.11937/72050

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