Wang, X., & Van Riessen, A. (2017). Omega-Phi compensated GID in side inclination mode for measurement of residual stress in polycrystalline thin films. International Centre for Diffraction Data.
Chicago Style (17th ed.) CitationWang, Xiaodong, and Arie Van Riessen. Omega-Phi Compensated GID in Side Inclination Mode for Measurement of Residual Stress in Polycrystalline Thin Films. International Centre for Diffraction Data, 2017.
MLA (9th ed.) CitationWang, Xiaodong, and Arie Van Riessen. Omega-Phi Compensated GID in Side Inclination Mode for Measurement of Residual Stress in Polycrystalline Thin Films. International Centre for Diffraction Data, 2017.
Warning: These citations may not always be 100% accurate.