Omega-Phi compensated GID in side inclination mode for measurement of residual stress in polycrystalline thin films
The grazing incidence diffraction (GID) method in side inclination mode, described by Ma et al. in 2002, of polycrystalline thin-film residual stress was revisited and explained using simple geometric relations. To overcome the issue of decreasing peak intensity of this method, which is induced by t...
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| Format: | Journal Article |
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International Centre for Diffraction Data
2017
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| Online Access: | https://www.cambridge.org/core/journals/powder-diffraction/article/omegaphi-compensated-gid-in-side-inclination-mode-for-measurement-of-residual-stress-in-polycrystalline-thin-films/CC62C6CCBEEFC32B75F3D0DA77E831EE http://hdl.handle.net/20.500.11937/71466 |