Polycrystalline materials analysis using the Maia pixelated energy-dispersive X-ray area detector

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Polycrystalline materials analysis using the Maia pixelated energy-dispersive X-ray area detector

Elemental, chemical, and structural analysis of polycrystalline materials at the micron scale is frequently carried out using microfocused synchrotron X-ray beams, sometimes on multiple instruments. The Maia pixelated energy-dispersive X-ray area detector enables the simultaneous collection of X-ray...

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Bibliographic Details
Main Authors:	Kirkwood, H., de Jonge, M., Howard, D., Ryan, C., van Riessen, G., Hofmann, F., Rowles, Matthew, Paradowska, A., Abbey, B.
Format:	Journal Article
Published:	International Centre for Diffraction Data 2017
Online Access:	http://hdl.handle.net/20.500.11937/60260

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