Polycrystalline materials analysis using the Maia pixelated energy-dispersive X-ray area detector
Elemental, chemical, and structural analysis of polycrystalline materials at the micron scale is frequently carried out using microfocused synchrotron X-ray beams, sometimes on multiple instruments. The Maia pixelated energy-dispersive X-ray area detector enables the simultaneous collection of X-ray...
| Main Authors: | , , , , , , , , |
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| Format: | Journal Article |
| Published: |
International Centre for Diffraction Data
2017
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| Online Access: | http://hdl.handle.net/20.500.11937/60260 |