Polycrystalline materials analysis using the Maia pixelated energy-dispersive X-ray area detector
Elemental, chemical, and structural analysis of polycrystalline materials at the micron scale is frequently carried out using microfocused synchrotron X-ray beams, sometimes on multiple instruments. The Maia pixelated energy-dispersive X-ray area detector enables the simultaneous collection of X-ray...
| Main Authors: | , , , , , , , , |
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| Format: | Journal Article |
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International Centre for Diffraction Data
2017
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| Online Access: | http://hdl.handle.net/20.500.11937/60260 |
| _version_ | 1848760592159997952 |
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| author | Kirkwood, H. de Jonge, M. Howard, D. Ryan, C. van Riessen, G. Hofmann, F. Rowles, Matthew Paradowska, A. Abbey, B. |
| author_facet | Kirkwood, H. de Jonge, M. Howard, D. Ryan, C. van Riessen, G. Hofmann, F. Rowles, Matthew Paradowska, A. Abbey, B. |
| author_sort | Kirkwood, H. |
| building | Curtin Institutional Repository |
| collection | Online Access |
| description | Elemental, chemical, and structural analysis of polycrystalline materials at the micron scale is frequently carried out using microfocused synchrotron X-ray beams, sometimes on multiple instruments. The Maia pixelated energy-dispersive X-ray area detector enables the simultaneous collection of X-ray fluorescence (XRF) and diffraction because of the relatively large solid angle and number of pixels when compared with other systems. The large solid angle also permits extraction of surface topography because of changes in self-absorption. This work demonstrates the capability of the Maia detector for simultaneous measurement of XRF and diffraction for mapping the short- and long-range order across the grain structure in a Ni polycrystalline foil. |
| first_indexed | 2025-11-14T10:18:13Z |
| format | Journal Article |
| id | curtin-20.500.11937-60260 |
| institution | Curtin University Malaysia |
| institution_category | Local University |
| last_indexed | 2025-11-14T10:18:13Z |
| publishDate | 2017 |
| publisher | International Centre for Diffraction Data |
| recordtype | eprints |
| repository_type | Digital Repository |
| spelling | curtin-20.500.11937-602602018-07-27T01:25:22Z Polycrystalline materials analysis using the Maia pixelated energy-dispersive X-ray area detector Kirkwood, H. de Jonge, M. Howard, D. Ryan, C. van Riessen, G. Hofmann, F. Rowles, Matthew Paradowska, A. Abbey, B. Elemental, chemical, and structural analysis of polycrystalline materials at the micron scale is frequently carried out using microfocused synchrotron X-ray beams, sometimes on multiple instruments. The Maia pixelated energy-dispersive X-ray area detector enables the simultaneous collection of X-ray fluorescence (XRF) and diffraction because of the relatively large solid angle and number of pixels when compared with other systems. The large solid angle also permits extraction of surface topography because of changes in self-absorption. This work demonstrates the capability of the Maia detector for simultaneous measurement of XRF and diffraction for mapping the short- and long-range order across the grain structure in a Ni polycrystalline foil. 2017 Journal Article http://hdl.handle.net/20.500.11937/60260 10.1017/S0885715617000768 International Centre for Diffraction Data restricted |
| spellingShingle | Kirkwood, H. de Jonge, M. Howard, D. Ryan, C. van Riessen, G. Hofmann, F. Rowles, Matthew Paradowska, A. Abbey, B. Polycrystalline materials analysis using the Maia pixelated energy-dispersive X-ray area detector |
| title | Polycrystalline materials analysis using the Maia pixelated energy-dispersive X-ray area detector |
| title_full | Polycrystalline materials analysis using the Maia pixelated energy-dispersive X-ray area detector |
| title_fullStr | Polycrystalline materials analysis using the Maia pixelated energy-dispersive X-ray area detector |
| title_full_unstemmed | Polycrystalline materials analysis using the Maia pixelated energy-dispersive X-ray area detector |
| title_short | Polycrystalline materials analysis using the Maia pixelated energy-dispersive X-ray area detector |
| title_sort | polycrystalline materials analysis using the maia pixelated energy-dispersive x-ray area detector |
| url | http://hdl.handle.net/20.500.11937/60260 |